le_g08_wafer [Inspectron docs]

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====== Release notes ======
===== Version 1.1.4.4366 =====
  * Ridge detection change. Ridge is brighter now
===== Version 1.1.3.4072 =====
  * increased ridge width tolerance
===== Version 1.1.2.4071 =====
  * Adjusted unpump sections
===== Version 1.1.1.4067 =====
  * Support for AOI2 added
===== Version 1.0.6.3800 =====
  * Decreased threshould of cross-detection to 40%
===== Version 1.0.5.3456 =====
  * fixed outer ridge scan for top area
  * fixed briging on ridge
===== Version 1.0.4.3444 =====
  * fixed ridge detection
===== Version 1.0.3.3443 =====
  * Fixed unpump detection
  * changed minimal defect area to 9
===== Version 1.0.2.3442 =====
  * look for ridge higher(ridge at the bottom of the die may be too narrow) during preparation
  * changed ignorance calculation to the same as in G09E_wafer
===== Version 1.0.1.3435 =====
  * Center alignment
===== Version 1.0.0.3434 =====
  * new recepie